Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics
- ISBN
- 9783642400742
Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics è un mathematics, functional analysis book di Mohamed S. Abdel-Hameed.
Informazioni su questo libro
This book covers Lévy processes and their applications in the contexts of reliability and storage. Special attention is paid to life distributions and the maintenance of devices subject to degradation; estimating the parameters of the degradation process is also discussed, as is the maintenance of dams subject to Lévy input.
Sull'Autore
è l'autore di Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics. Esplora il suo catalogo completo su Booklogr.
Esplora altri libri di Mohamed S. Abdel-Hameed →Edizioni e Formati
Recensioni
Nessuna recensione ancora. Hai letto questo libro? Condividi le tue impressioni con la comunità di Booklogr.
Accedi Accedi per scrivere una recensione
Domande Frequenti
Di che genere è Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics?+
Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics è un libro di Mathematics, Functional analysis, Distribution, Industrial engineering, Probability Theory and Stochastic Processes.
Di cosa parla Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics?+
This book covers Lévy processes and their applications in the contexts of reliability and storage. Special attention is paid to life distributions and the maintenance of devices subject to degradation; estimating the parameters of the degradation process is also discussed, as is the maintenance of d...
Chi ha scritto Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics?+
Levy Processes and Their Applications in Reliability and Storage Springerbriefs in Statistics è stato scritto da Mohamed S. Abdel-Hameed.